INDEP approach for leakage reduction in nanoscale CMOS circuits
- 期刊名称International Journal of Electronics
- 作者Sharma, Vijay Kumar; Pattanaik, Manisha; Raj, Balwinder
- 卷第102卷
- 期第2期
- 印刷ISSN0020-7217
- 电子ISSN1362-3060
- 文件大小456.73KB
- 发表时间2015-02
- DOI10.1080/00207217.2014.896042
- 页码200-215
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