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Variations in Nanometer CMOS Flip-Flops: Part II—Energy Variability and Impact of Other Sources of Variations

Variations in Nanometer CMOS Flip-Flops: Part II—Energy Variability and Impact of Other Sources of Variations

Alioto, Massimo; Consoli, Elio; Palumbo, Gaetano

期刊名称IEEE Transactions on Circuits and Systems I: Regular Papers
作者Alioto, Massimo; Consoli, Elio; Palumbo, Gaetano
卷第62卷
期第3期
印刷ISSN1549-8328
电子ISSN1558-0806
文件大小1709.43KB
发表时间2015-3
DOI10.1109/tcsi.2014.2366813
页码835-843

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