Isolated Ti in Si: Deep level transient spectroscopy, minority carrier transient spectroscopy, and high-resolution Laplace deep level transient spectroscopy studies
- 期刊名称Journal of Applied Physics
- 作者Scheffler, L.; Kolkovsky, Vl.; Weber, J.
- 卷第117卷
- 期第4期
- 印刷ISSN0021-8979
- 电子ISSN1089-7550
- 文件大小1167.04KB
- 发表时间2015-01-28
- DOI10.1063/1.4906855
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