Reliability assessment of germanium gate stacks with promising initial characteristics
- 期刊名称Applied Physics Express
- 作者Lu, Cimang; Lee, Choong Hyun; Nishimura, Tomonori; Nagashio, Kosuke; Toriumi, Akira
- 卷第8卷
- 期第2期
- 印刷ISSN1882-0778
- 电子ISSN1882-0786
- 文件大小1291.03KB
- 发表时间2015-02-01
- DOI10.7567/APEX.8.021301
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