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Impact analysis of deep-submicron CMOS technologies on the voltage and temperature independence of a time-domain sensor interface

Impact analysis of deep-submicron CMOS technologies on the voltage and temperature independence of a time-domain sensor interface

De Smedt, Valentijn; Gielen, Georges; Dehaene, Wim
  • 期刊名称Analog Integrated Circuits and Signal Processing
  • 作者De Smedt, Valentijn; Gielen, Georges; Dehaene, Wim
  • 卷第82卷
  • 期第1期
  • 印刷ISSN0925-1030
  • 电子ISSN1573-1979
  • 文件大小1056.66KB
  • 发表时间2015-1
  • DOI10.1007/s10470-014-0452-4
  • 页码285-296
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