On the use of a ZrOx-SiO2multilayer structure as a test sample for high-resolution X-ray microscopy

Medvedeva, S. S.; Lyatun, I. I.; Ershov, P. A.; Goikhman, A. Yu.; Snigireva, I. I.; Snigirev, A. A.

期刊名称Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
作者Medvedeva, S. S.; Lyatun, I. I.; Ershov, P. A.; Goikhman, A. Yu.; Snigireva, I. I.; Snigirev, A. A.
卷第9卷
期第2期
印刷ISSN1027-4510
电子ISSN1819-7094
文件大小1215.41KB
发表时间2015-3
DOI10.1134/S1027451015020354
页码341-345

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