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Output gating performance overhead elimination for scan test

Output gating performance overhead elimination for scan test

Suhag, Ashok Kumar; Ahlawat, Satdev; Shrivastava, Vivek; Choudhary, Rahul Raj
  • 期刊名称International Journal of Electronics
  • 作者Suhag, Ashok Kumar; Ahlawat, Satdev; Shrivastava, Vivek; Choudhary, Rahul Raj
  • 卷第102卷
  • 期第7期
  • 印刷ISSN0020-7217
  • 电子ISSN1362-3060
  • 文件大小377.95KB
  • 发表时间2015-07-03
  • DOI10.1080/00207217.2014.977357
  • 页码1244-1252
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