Ferroelectric domain structures and thickness scaling of epitaxial BiFeO3 thin films
- 期刊名称Materials Letters
- 作者Ahn, Yoonho; Seo, Jeongdae; Yeog Son, Jong; Jang, Joonkyung
- 卷第154卷
- 印刷ISSN0167-577X
- 文件大小2889.29KB
- 发表时间2015-09
- DOI10.1016/j.matlet.2015.04.072
- 页码25-28
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