SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco, California, USA (Sunday 8 February 2015)] Document Recognition and Retrieval XXII - Ground truth model, tool, and dataset for layout analysis of historical documents
Ringger, Eric K.; Lamiroy, Bart; Chen, Kai; Seuret, Mathias; Wei, Hao; Liwicki, Marcus; Hennebert, Jean; Ingold, Rolf
- 作者Ringger, Eric K.; Lamiroy, Bart; Chen, Kai; Seuret, Mathias; Wei, Hao; Liwicki, Marcus; Hennebert, Jean; Ingold, Rolf
- 卷第9402卷
- 印刷ISSN0277-786X
- 文件大小2178.79KB
- 发表时间2015
- DOI10.1117/12.2075858