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[IEEE 2015 16th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2015.3.2-2015.3.4)] Sixteenth International Symposium on Quality Electronic Design - Digital PUF using intentional faults

[IEEE 2015 16th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2015.3.2-2015.3.4)] Sixteenth International Symposium on Quality Electronic Design - Digital PUF using intentional faults

Xu, Teng; Potkonjak, Miodrag
  • 作者Xu, Teng; Potkonjak, Miodrag
  • 文件大小1456.07KB
  • 发表时间2015
  • DOI10.1109/isqed.2015.7085467
  • 页码448-451
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