[IEEE 2015 International Conference on Industrial Instrumentation and Control (ICIC) - Pune, India (2015.5.28-2015.5.30)] 2015 International Conference on Industrial Instrumentation and Control (ICIC) - Beyond test pattern generation: Coverage analysis

• 作者Bhowmik, Biswajit; Deka, Jatindra Kumar; Biswas, Santosh
• 文件大小173.69KB
• 发表时间2015
• DOI10.1109/IIC.2015.7151009
• 页码1620-1625