Life-data analysis for condition assessment of high-voltage assets
Chmura, Lukasz; Morshuis, Peter H. F.; Smit, Johan J.; Janssen, Anton
- 期刊名称IEEE Electrical Insulation Magazine
- 作者Chmura, Lukasz; Morshuis, Peter H. F.; Smit, Johan J.; Janssen, Anton
- 卷第31卷
- 期第5期
- 印刷ISSN0883-7554
- 文件大小3297.92KB
- 发表时间2015-9
- DOI10.1109/MEI.2015.7214443
- 页码33-43