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The effect of stacking sequence and thickness on the structure and microwave dielectric properties of heterogenous Ca(Mg1/3Ta2/3)O3/CaTiO3thin films

The effect of stacking sequence and thickness on the structure and microwave dielectric properties of heterogenous Ca(Mg1/3Ta2/3)O3/CaTiO3thin films

Li, Runrun; Chen, Wen; Zhou, Jing; Sun, Huajun; Bao, Yiwang

期刊名称Journal of Materials Science: Materials in Electronics
作者Li, Runrun; Chen, Wen; Zhou, Jing; Sun, Huajun; Bao, Yiwang
卷第26卷
期第10期
印刷ISSN0957-4522
电子ISSN1573-482X
文件大小1261.41KB
发表时间2015-10
DOI10.1007/s10854-015-3365-9
页码7361-7366

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