[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Connecting the physical and application level towards grasping aging effects
- 作者Amrouch, Hussam; Martin-Martinez, Javier; van Santen, Victor M.; Moras, Miquel; Rodriguez, Rosana; Nafria, Montserrat; Henkel, Jorg
- 文件大小1945.12KB
- 发表时间2015
- DOI10.1109/IRPS.2015.7112711
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