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Two-dimensional
              <i>in situ</i>
              metrology of X-ray mirrors using the speckle scanning technique

Two-dimensional in situ metrology of X-ray mirrors using the speckle scanning technique

Wang, Hongchang; Kashyap, Yogesh; Laundy, David; Sawhney, Kawal
  • 期刊名称Journal of Synchrotron Radiation
  • 作者Wang, Hongchang; Kashyap, Yogesh; Laundy, David; Sawhney, Kawal
  • 卷第22卷
  • 期第4期
  • 电子ISSN1600-5775
  • 文件大小582.51KB
  • 发表时间2015-07-01
  • DOI10.1107/S1600577515006657
  • 页码925-929
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