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On the reliability estimation of nano-circuits using neural networks

On the reliability estimation of nano-circuits using neural networks

Beg, Azam; Awwad, Falah; Ibrahim, Walid; Ahmed, Faheem

期刊名称Microprocessors and Microsystems
作者Beg, Azam; Awwad, Falah; Ibrahim, Walid; Ahmed, Faheem
卷第39卷
期第8期
印刷ISSN0141-9331
文件大小1256.05KB
发表时间2015-11
DOI10.1016/j.micpro.2015.09.008
页码674-685

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