Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays
Grossi, Alessandro; Walczyk, Damian; Zambelli, Cristian; Miranda, Enrique; Olivo, Piero; Stikanov, Valeriy; Feriani, Alessandro; Sune, Jordi; Schoof, Gunter; Kraemer, Rolf; Tillack, Bernd; Fox, Alexander; Schroeder, Thomas; Wenger, Christian; Walczyk, Christian
- 期刊名称IEEE Transactions on Electron Devices
- 作者Grossi, Alessandro; Walczyk, Damian; Zambelli, Cristian; Miranda, Enrique; Olivo, Piero; Stikanov, Valeriy; Feriani, Alessandro; Sune, Jordi; Schoof, Gunter; Kraemer, Rolf; Tillack, Bernd; Fox, Alexander; Schroeder, Thomas; Wenger, Christian; Walczyk, Christian
- 卷第62卷
- 期第8期
- 印刷ISSN0018-9383
- 电子ISSN1557-9646
- 文件大小5006.09KB
- 发表时间2015-8
- DOI10.1109/TED.2015.2442412
- 页码2502-2509