[IEEE 2015 30th Symposium on Microelectronics Technology and Devices (SBMicro) - Salvador, Brazil (2015.8.31-2015.9.4)] 2015 30th Symposium on Microelectronics Technology and Devices (SBMicro) - Analysis of analog parameters in NW-TFETs with Si and SiGe source composition at high temperatures
Bordallo, Caio C. M.; Martino, Joao A.; Agopian, Paula G. D.; Rooyackers, R.; Vandooren, A.; Thean, A.; Simoen, Eddy; Claeys, Cor
- 作者Bordallo, Caio C. M.; Martino, Joao A.; Agopian, Paula G. D.; Rooyackers, R.; Vandooren, A.; Thean, A.; Simoen, Eddy; Claeys, Cor
- 文件大小825.43KB
- 发表时间2015
- DOI10.1109/SBMicro.2015.7298148
- 页码1-4