Improving the print quality of screenshots
Mikheev, S. M.; Kurilin, I. V.; Vil’kin, A. M.; Rychagov, M. N.; Lee, Ho Keun; Kim, Sang Ho; Choi, Don Chul
- 期刊名称Pattern Recognition and Image Analysis
- 作者Mikheev, S. M.; Kurilin, I. V.; Vil’kin, A. M.; Rychagov, M. N.; Lee, Ho Keun; Kim, Sang Ho; Choi, Don Chul
- 卷第25卷
- 期第4期
- 印刷ISSN1054-6618
- 电子ISSN1555-6212
- 文件大小4904.10KB
- 发表时间2015-10
- DOI10.1134/S1054661815040173
- 页码674-684