[IEEE 2015 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) - Gaithersburg, MD, USA (2015.11.2-2015.11.5)] 2015 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) - Automated generation of failure modes and effects analysis for a medical device
Hecht, Myron; Nguyen, Elisabeth; Chuidian, Aaron; Pinchak, Julia
- 作者Hecht, Myron; Nguyen, Elisabeth; Chuidian, Aaron; Pinchak, Julia
- 文件大小340.32KB
- 发表时间2015
- DOI10.1109/issrew.2015.7392032
- 页码29-32