SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Imaging Spectrometry XX - A comparative study of three vision systems for metal surface defect detection
- 作者Pagano, Thomas S.; Silny, John F.; Mehrubeoglu, Mehrube; Simionescu, Petru-Aurelian; Robinson, Shawn; McLauchlan, Lifford
- 卷第9611卷
- 印刷ISSN0277-786X
- 文件大小817.06KB
- 发表时间2015
- DOI10.1117/12.2190216
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