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[IEEE 2015 International Workshop on Computational Electronics (IWCE) - West Lafayette, IN, USA (2015.9.2-2015.9.4)] 2015 International Workshop on Computational Electronics (IWCE) - Analytic solution of ando’s surface roughness model with finite domain distribution functions

[IEEE 2015 International Workshop on Computational Electronics (IWCE) - West Lafayette, IN, USA (2015.9.2-2015.9.4)] 2015 International Workshop on Computational Electronics (IWCE) - Analytic solution of ando’s surface roughness model with finite domain distribution functions

Moors, Kristof; Soree, Bart; Magnus, Wim

作者Moors, Kristof; Soree, Bart; Magnus, Wim
文件大小1890.41KB
发表时间2015
DOI10.1109/iwce.2015.7301975
页码1-4

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