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[IEEE 2015 IEEE International Conference on RFID Technology and Applications (RFID-TA) - Tokyo, Japan (2015.9.16-2015.9.18)] 2015 IEEE International Conference on RFID Technology and Applications (RFID-TA) - Backwards compatible improvement of the EPCglobal class 1 gen 2 standard

[IEEE 2015 IEEE International Conference on RFID Technology and Applications (RFID-TA) - Tokyo, Japan (2015.9.16-2015.9.18)] 2015 IEEE International Conference on RFID Technology and Applications (RFID-TA) - Backwards compatible improvement of the EPCglobal class 1 gen 2 standard

Ahmed, Hazem A.; Salah, Hamed; Robert, Joerg; Heuberger, Albert

作者Ahmed, Hazem A.; Salah, Hamed; Robert, Joerg; Heuberger, Albert
文件大小576.86KB
发表时间2015
DOI10.1109/rfid-ta.2015.7379804
页码114-119

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