[IEEE 2015 Conference on Design of Circuits and Integrated Systems (DCIS) - Estoril, Portugal (2015.11.25-2015.11.27)] 2015 Conference on Design of Circuits and Integrated Systems (DCIS) - Observability solutions for in-field functional test of processor-based systems

• 作者Acle, J. Perez; Cantoro, R.; Hailemichael, A.T.; Sanchez, E.; Reorda, M. Sonza
• 文件大小214.21KB
• 发表时间2015
• DOI10.1109/dcis.2015.7388582
• 页码1-6