[IEEE 2015 Conference on Design of Circuits and Integrated Systems (DCIS) - Estoril, Portugal (2015.11.25-2015.11.27)] 2015 Conference on Design of Circuits and Integrated Systems (DCIS) - About the functional test of permanent faults in distributed systems

• 作者Vaskova, A.; Portela-Garcia, M.; Lopez-Ongil, C.; Sanchez, E.; Reorda, M. Sonza
• 文件大小826.55KB
• 发表时间2015
• DOI10.1109/dcis.2015.7388571
• 页码1-6