[IEEE 2015 Conference on Design of Circuits and Integrated Systems (DCIS) - Estoril, Portugal (2015.11.25-2015.11.27)] 2015 Conference on Design of Circuits and Integrated Systems (DCIS) - Embedding Fault List Compression techniques in a design automation framework for analog and Mixed-Signal structural testing
- 作者Martins, Ricardo; Lourenco, Nuno; Horta, Nuno; Guerreiro, Nuno; Santos, Marcelino
- 文件大小954.61KB
- 发表时间2015
- DOI10.1109/dcis.2015.7388584
- 页码1-6
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