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[IEEE 2015 International Conference on Microwave, Optical and Communication Engineering (ICMOCE) - Bhubaneswar, India (2015.12.18-2015.12.20)] 2015 International Conference on Microwave, Optical and Communication Engineering (ICMOCE) - Effect of interface roughness scattering and temperature on quantum cascade detectors

[IEEE 2015 International Conference on Microwave, Optical and Communication Engineering (ICMOCE) - Bhubaneswar, India (2015.12.18-2015.12.20)] 2015 International Conference on Microwave, Optical and Communication Engineering (ICMOCE) - Effect of interface roughness scattering and temperature on quantum cascade detectors

Saha, Sumit; Kumar, Jitendra; Ajitesh,
  • 作者Saha, Sumit; Kumar, Jitendra; Ajitesh,
  • 文件大小333.63KB
  • 发表时间2015
  • DOI10.1109/ICMOCE.2015.7489739
  • 页码254-257
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