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[IEEE 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Qingdao, China (2015.7.16-2015.7.18)] 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Experimental study on the partial discharge development of the fixed protrusion on the enclosure defect in GIS

[IEEE 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Qingdao, China (2015.7.16-2015.7.18)] 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Experimental study on the partial discharge development of the fixed protrusion on the enclosure defect in GIS

Yao Rui, ; Si Gangquan, ; Zhang Yanbin, ; Yuan Yiwei, ; Xie Qian,
  • 作者Yao Rui, ; Si Gangquan, ; Zhang Yanbin, ; Yuan Yiwei, ; Xie Qian,
  • 文件大小13185.34KB
  • 发表时间2015
  • DOI10.1109/icemi.2015.7494258
  • 页码228-232
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