[IEEE 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Qingdao, China (2015.7.16-2015.7.18)] 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) - Experimental study on the partial discharge development of the fixed protrusion on the enclosure defect in GIS
Yao Rui, ; Si Gangquan, ; Zhang Yanbin, ; Yuan Yiwei, ; Xie Qian,
- 作者Yao Rui, ; Si Gangquan, ; Zhang Yanbin, ; Yuan Yiwei, ; Xie Qian,
- 文件大小13185.34KB
- 发表时间2015
- DOI10.1109/icemi.2015.7494258
- 页码228-232