[IEEE Conference Publications Design, Automation and Test in Europe - Grenoble, France (2015.03.9-2015.03.13)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 - A Generic, Scalable and Globally Arbitrated Memory Tree for Shared DRAM Access in Real-Time Systems
- 作者Gomony, Manil Dev; Garside, Jamie; Akesson, Benny; Audsley, Neil; Goossens, Kees
- 文件大小339.89KB
- 发表时间2015
- DOI10.7873/DATE.2015.0390
- 页码193-198
[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - PUFs at a glanceRuhrmair, Ulrich; Holcomb, Daniel E. · 2014
[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - PUFs at a glanceRuhrmair, Ulrich; Holcomb, Daniel E. · 2014
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[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - A universal symmetry detection algorithmMaurer, Peter M. · 2014
[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - RETLab: A fast design-automation framework for arbitrary RET networksMottaghi, Mohammad D.; Rallapalli, Arjun; Dwyer, Chris · 2014
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[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - A landscape of the new dark silicon design regimeTaylor, Michael B. · 2014
[IEEE Conference Publications Design, Automation and Test in Europe - Grenoble, France (2015.03.9-2015.03.13)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015 - A General Design of Stochastic Circuit and Its SynthesisZhao, Zheng; Qian, Weikang · 2015