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[IEEE 2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC) - Macao, Macao (2016.1.25-2016.1.28)] 2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC) - Laplacian eigenmaps and bayesian clustering based layout pattern sampling and its applications to hotspot detection and OPC

[IEEE 2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC) - Macao, Macao (2016.1.25-2016.1.28)] 2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC) - Laplacian eigenmaps and bayesian clustering based layout pattern sampling and its applications to hotspot detection and OPC

Matsunawa, Tetsuaki; Yu, Bei; Pan, David Z.

作者Matsunawa, Tetsuaki; Yu, Bei; Pan, David Z.
文件大小268.96KB
发表时间2016
DOI10.1109/aspdac.2016.7428090
页码679-684

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