[IEEE 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID) - Kolkata, India (2016.1.4-2016.1.8)] 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID) - RF System Design of an RFIC Receiver for IoT
- 作者Sengupta, Susanta
- 文件大小141.38KB
- 发表时间2016
- DOI10.1109/vlsid.2016.139
- 页码24-24
Fault diagnosis in loop-connected systemsKewal K. Saluja; Brian D.O. Anderson · 1980
Testable design of large random access memoriesKewal K. Saluja; Kim Thang Le · 1984
On-chip testing of random access memoriesKewal K. Saluja · 1994
Sequential test generators: past, present and futureYong Chang Kim; Kewal K. Saluja · 1998
Incorporating testability considerations in high-level synthesisAshutosh Mujumdar; Rajiv Jain; Kewal Saluja · 1994
Vulnerability of Surveillance Networks to FaultsChin, Tai-Lin; Clouqueur, Thomas; Ramanathan, Parameswaran; Saluja, Kewal K. · International Journal of Distributed Sensor Networks · 2006
HYSIM: Hybrid Fault Simulation for Synchronous Sequential CircuitsKim, Kyuchull; Saluja, Kewal K. · VLSI Design · 1996
A Heuristic Measure to Maximize Detected Faults per TestKim T. Le; Kewal K. Saluja · 1998