[IEEE 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID) - Kolkata, India (2016.1.4-2016.1.8)] 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID) - Thermal-Safe Schedule Generation for System-on-Chip Testing
- 作者Karmakar, Rajit; Chattopadhyay, Santanu
- 文件大小704.30KB
- 发表时间2016
- DOI10.1109/vlsid.2016.47
- 页码475-480
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