发现好书期刊,享受阅读乐趣

海量图书期刊资源,随时随地畅享阅读乐趣

Engineering Single Defects in Silicon Carbide Bulk, Nanostructures and Devices

Engineering Single Defects in Silicon Carbide Bulk, Nanostructures and Devices

Lohrmann, Alexander; Johnson, B.C.; Almutairi, A.F.M.; Lau, D.W.M.; Negri, Marco; Bosi, Matteo; Gibson, B.C.; McCallum, J.C.; Gali, Adam; Ohshima, Takeshi; Castelletto, Stefania
  • 期刊名称Materials Science Forum
  • 作者Lohrmann, Alexander; Johnson, B.C.; Almutairi, A.F.M.; Lau, D.W.M.; Negri, Marco; Bosi, Matteo; Gibson, B.C.; McCallum, J.C.; Gali, Adam; Ohshima, Takeshi; Castelletto, Stefania
  • 卷第858卷
  • 电子ISSN1662-9752
  • 文件大小1658.64KB
  • 发表时间2016-5
  • DOI10.4028/www.scientific.net/MSF.858.312
  • 页码312-317
← 返回【学霸图书馆】主页