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[IEEE 2016 International Siberian Conference on Control and Communications (SIBCON) - Moscow, Russia (2016.5.12-2016.5.14)] 2016 International Siberian Conference on Control and Communications (SIBCON) - The regularities of radiation defect formation at the interface metal — n-InP

[IEEE 2016 International Siberian Conference on Control and Communications (SIBCON) - Moscow, Russia (2016.5.12-2016.5.14)] 2016 International Siberian Conference on Control and Communications (SIBCON) - The regularities of radiation defect formation at the interface metal — n-InP

Soboleva, E. G.; Litvinenko, V. V.; Kit, T. B.

作者Soboleva, E. G.; Litvinenko, V. V.; Kit, T. B.
文件大小236.02KB
发表时间2016
DOI10.1109/sibcon.2016.7491677
页码1-4

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