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Measuring technological distance for patent mapping

Measuring technological distance for patent mapping

Yan, Bowen; Luo, Jianxi

期刊名称Journal of the Association for Information Science and Technology
作者Yan, Bowen; Luo, Jianxi
印刷ISSN2330-1635
文件大小430.27KB
发表时间2016-03
DOI10.1002/asi.23664

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