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Experimental Study on Deformation Potential (<i>D<sub>ac</sub></i>) in MOSFETs: Demonstration of Increased <i>D<sub>ac</sub></i> at MOS Interfaces and Its Impact on Electron Mobility

Experimental Study on Deformation Potential (D_ac) in MOSFETs: Demonstration of Increased D_ac at MOS Interfaces and Its Impact on Electron Mobility

Ohashi, Teruyuki; Tanaka, Takahisa; Takahashi, Tsunaki; Oda, Shunri; Uchida, Ken

期刊名称IEEE Journal of the Electron Devices Society
作者Ohashi, Teruyuki; Tanaka, Takahisa; Takahashi, Tsunaki; Oda, Shunri; Uchida, Ken
电子ISSN2168-6734
文件大小3047.84KB
发表时间2016
DOI10.1109/jeds.2016.2581217
页码1-1

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