Intermittent-contact Scanning Electrochemical Microscopy (IC-SECM) as a Quantitative Probe of Defects in Single Crystal Boron Doped Diamond Electrodes
- 期刊名称Electroanalysis
- 作者Tomlinson, Lucy I.; Patten, Hollie V.; Green, Ben L.; Iacobini, James; Meadows, Katherine E.; McKelvey, Kim; Unwin, Patrick R.; Newton, Mark E.; Macpherson, Julie V.
- 印刷ISSN1040-0397
- 文件大小822.69KB
- 发表时间2016
- DOI10.1002/elan.201600291
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