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Semi-Empirical Method for Estimation of Single-Event Upset Cross Section for SRAM DICE Cells

Semi-Empirical Method for Estimation of Single-Event Upset Cross Section for SRAM DICE Cells

Gorbunov, Maxim S.; Boruzdina, Anna B.; Dolotov, Pavel S.
  • 期刊名称IEEE Transactions on Nuclear Science
  • 作者Gorbunov, Maxim S.; Boruzdina, Anna B.; Dolotov, Pavel S.
  • 印刷ISSN0018-9499
  • 电子ISSN1558-1578
  • 文件大小1236.92KB
  • 发表时间2016
  • DOI10.1109/TNS.2016.2549749
  • 页码1-7
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