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[IEEE 2016 IEEE International Conference on Industrial Technology (ICIT) - Taipei, Taiwan (2016.3.14-2016.3.17)] 2016 IEEE International Conference on Industrial Technology (ICIT) - Inter-turn short fault diagnosis of permanent magnet synchronous machines using negative sequence components

[IEEE 2016 IEEE International Conference on Industrial Technology (ICIT) - Taipei, Taiwan (2016.3.14-2016.3.17)] 2016 IEEE International Conference on Industrial Technology (ICIT) - Inter-turn short fault diagnosis of permanent magnet synchronous machines using negative sequence components

Jeong, Hyeyun; Moon, Seokbae; Lee, Jewon; Kim, Sang Woo

作者Jeong, Hyeyun; Moon, Seokbae; Lee, Jewon; Kim, Sang Woo
文件大小379.00KB
发表时间2016
DOI10.1109/icit.2016.7474745
页码170-174

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