Advanced Characterization Techniques for Thin Film Solar Cells || Soft X-ray and Electron Spectroscopy: A Unique “Tool Chest” to Characterize the Chemical and Electronic Properties of Surfaces and Interfaces
- 作者Abou-Ras, Daniel; Kirchartz, Thomas; Rau, Uwe
- 文件大小878.28KB
- 发表时间2016
- DOI10.1002/9783527699025.ch18
- 页码501-522
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