Surface Passivation for Reliable Measurement of Bulk Electronic Properties of Heterojunction Devices

Bissig, Benjamin; Guerra-Nunez, Carlos; Carron, Romain; Nishiwaki, Shiro; La Mattina, Fabio; Pianezzi, Fabian; Losio, Paolo A.; Avancini, Enrico; Reinhard, Patrick; Haass, Stefan G.; Lingg, Martina; Feurer, Thomas; Utke, Ivo; Buecheler, Stephan; Tiwari, Ayodhya N.

期刊名称Small
作者Bissig, Benjamin; Guerra-Nunez, Carlos; Carron, Romain; Nishiwaki, Shiro; La Mattina, Fabio; Pianezzi, Fabian; Losio, Paolo A.; Avancini, Enrico; Reinhard, Patrick; Haass, Stefan G.; Lingg, Martina; Feurer, Thomas; Utke, Ivo; Buecheler, Stephan; Tiwari, Ayodhya N.
印刷ISSN1613-6810
文件大小1719.33KB
发表时间2016-08
DOI10.1002/smll.201601575

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Surface Passivation for Reliable Measurement of Bulk Electronic Properties of Heterojunction Devices