(Invited) Characterization of Buried Interfaces with Scanning Probe Microscopes
- 期刊名称ECS Transactions
- 作者Kopanski, J. J.; You, L.; Li, J.; Ahn, J. J.; Obeng, Y. S.
- 卷第72卷
- 期第2期
- 印刷ISSN1938-6737
- 电子ISSN1938-5862
- 文件大小627.39KB
- 发表时间2016-05-19
- DOI10.1149/07202.0131ecst
- 页码131-138
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