[IEEE 2016 International Conference on Applied Electronics (AE) - Pilsen, Czech Republic (2016.9.6-2016.9.7)] 2016 International Conference on Applied Electronics (AE) - Internet protocol based digital counters for legacy fatigue testing machines
Pancik, Juraj; Kukucka, Marek
- 作者Pancik, Juraj; Kukucka, Marek
- 文件大小542.52KB
- 发表时间2016
- DOI10.1109/AE.2016.7577272
- 页码195-200