FPGA LUT delay degradation due to HCI: Experiment and simulation results
- 期刊名称Microelectronics Reliability
- 作者Naouss, M.; Marc, F.
- 印刷ISSN0026-2714
- 文件大小2099.29KB
- 发表时间2016-9
- DOI10.1016/j.microrel.2016.07.048
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