[ACM Press the 31st IEEE/ACM International Conference - Singapore, Singapore (2016.09.03-2016.09.07)] Proceedings of the 31st IEEE/ACM International Conference on Automated Software Engineering - ASE 2016 - Fine-tuning spectrum based fault localisation with frequent method item sets
Laghari, Gulsher; Murgia, Alessandro; Demeyer, Serge
- 作者Laghari, Gulsher; Murgia, Alessandro; Demeyer, Serge
- 文件大小596.52KB
- 发表时间2016
- DOI10.1145/2970276.2970308
- 页码274-285