Reliability Degradation Mechanisms of Horizontal Current Bipolar Transistor
- 期刊名称IEEE Transactions on Electron Devices
- 作者Zilak, Josip; Koricic, Marko; Suligoj, Tomislav
- 卷第63卷
- 期第11期
- 印刷ISSN0018-9383
- 电子ISSN1557-9646
- 文件大小4290.91KB
- 发表时间2016-11
- DOI10.1109/TED.2016.2611246
- 页码4409-4415
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