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[IEEE 2016 39th International Spring Seminar on Electronics Technology (ISSE) - Pilsen, Czech Republic (2016.5.18-2016.5.22)] 2016 39th International Spring Seminar on Electronics Technology (ISSE) - Behavioral dimensional SPICE models of thick-film resistors at cryogenic temperatures

[IEEE 2016 39th International Spring Seminar on Electronics Technology (ISSE) - Pilsen, Czech Republic (2016.5.18-2016.5.22)] 2016 39th International Spring Seminar on Electronics Technology (ISSE) - Behavioral dimensional SPICE models of thick-film resistors at cryogenic temperatures

Balik, Franciszek; Dziedzic, Andrzej

作者Balik, Franciszek; Dziedzic, Andrzej
文件大小552.82KB
发表时间2016
DOI10.1109/ISSE.2016.7563254
页码527-534

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