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Catastrophic degradation of InGaN/GaN blue laser diodes

Catastrophic degradation of InGaN/GaN blue laser diodes

Wen, Pengyan; Zhang, Shuming; Liu, Jianping; Li, Deyao; Zhang, Liqun; Zhou, Kun; Su, Xujun; Tian, Aiqin; Zhang, Feng; Yang, Hui
  • 期刊名称IEEE Transactions on Device and Materials Reliability
  • 作者Wen, Pengyan; Zhang, Shuming; Liu, Jianping; Li, Deyao; Zhang, Liqun; Zhou, Kun; Su, Xujun; Tian, Aiqin; Zhang, Feng; Yang, Hui
  • 印刷ISSN1530-4388
  • 电子ISSN1558-2574
  • 文件大小534.48KB
  • 发表时间2016
  • DOI10.1109/TDMR.2016.2617885
  • 页码1-1
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