Interdependencies of Degradation Effects and their Impact on Computing
- 期刊名称IEEE Design & Test
- 作者Amrouch, Hussam; van Santen, Victor M.; Henkel, Jorg
- 印刷ISSN2168-2356
- 电子ISSN2168-2364
- 文件大小3468.46KB
- 发表时间2016
- DOI10.1109/mdat.2016.2594180
- 页码1-1
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