[IEEE 2016 IEEE 34th International Conference on Computer Design (ICCD) - Scottsdale, AZ, USA (2016.10.2-2016.10.5)] 2016 IEEE 34th International Conference on Computer Design (ICCD) - A statistical critical path monitor in 14nm CMOS

• 作者Fleischer, Bruce; Vezyrtzis, Christos; Balakrishnan, Karthik; Jenkins, Keith A.
• 文件大小589.49KB
• 发表时间2016
• DOI10.1109/iccd.2016.7753334
• 页码507-511